1. wide application 2. 30VA Power suppluy 3. 3092 Permeameter 4. Epstein circle

DX-30SST Silicon Steel Sheet Iron Loss Tester

Product Introduction

Silicon steel sheet iron loss tester is one of important evaluation indexs for quality management during silicon steel sheet production, circulation and use.This test can judge the quality of silicon steel sheet material, early detect the defects of material, which brings great convenience for the motor, transformers and related manufacturers’ quality management.

According to Chinese industry standard ( GB / 3655-2000 ), it uses the Epstein circle as the basis of checking and evaluating the iron loss of silicon steel sheet, this method is also recommended by the international IEC standards. The permeameter design and test sampling of DX-30SST are in full compliance with international standards, make the test results more accurate, suitable for testing all the specifications of the product. Connected with a miniature square circle (scaled down according to the international standard gauge Epstein circle), with the computer via MS232 interface, which can completely replace of silicon steel measuring device, to achieve all the parameters measurement of silicon steel. It will save about 60% spending for small and medium sized users doing higher precision measurement, directly using the permeameter measuring will be much cheaper, more convenient.

Technical Index

1. 30VA Power suppluy1) Frequency: 50Hz/60H, Accuracy: 0.05%2) Power: 20V/1.5A, Accuracy: 0.1%2. 3092 Premeameter1) Suitable sample wafer: Length: >90mm, Width: 20-30mm, Thickness:0.1-1.0mm2) Just adopt single DX-30SST, collocated with premeameter to test sample:Total loss ratio PS:0.1—1.9T(continuously adjustable), Accuracy: 2.5%The setting range of saturation magnetic induction Bm: 0.5—1.9T, Accuracy: 2.0%The setting range of exciation intensity Hm: 10000A/m continuously settable, Accuracy:2.5%3. 140 Epstein circle1) suitable sample wafer: Length: >140mm, Width: 15mm, Weight:192g2) Just adopt single DX-30SST, collocated with mini-circle to test sample wafer:Total loss ratio PS:0.1—1.9T(continuously adjustable), Accuracy: 1.5%The setting range of saturation magnetic induction Bm: 0.5—1.9T, Accuracy: 1.0%The setting range of exciation intensity Hm: 3000A/m continuously settable, Accuracy: 1.5%