X-ray fluorescence spectrometer, from Al (13) to U (92) can be analyzed.

 

X-ray fluorescence spectrometer

X-Ray Spectrometer for Precious Metal

(Desktop, Model: SQ-4600, High Precision, without computer)

 

 

Introduction

SQ-4600 is a reflection of X-ray fluorescence analysis of the latest developments in energy Dispersion X-ray fluorescence spectrometer. It uses low-power and small-scale X-ray tube for excitation source, Si-pin detector with electrical refrigeration unit for the detection, coupled with the development of my company specializes in software applications, and give full play to the excellent performance of all components to ensure that the entire high-resolution instrument and general adaptability. At the same time, any multi-element analysis of the needs of the local is it of the lot. Instrument detection capability, high resolution ratio, applicable to all industries for different elements of non-destructive testing. Working in different environments and ranging from analysis of Al (13 element) to U (92 element). Rapid non-destructive analysis without sample preparation, testing time adjustable from a few seconds to several minutes. Detection accuracy from the PPM level to the thousandth level.

Function

The fundamental parameter method from Aluminum (13 element) to Uranium (92 element) a qualitative analysis of measurement. Parcel Identification System testing samples.Room high-definition imaging sample positioning system, to facilitate measurement     of small sample location.Electric refrigeration and cooling cycle of the internal two-way system a combination of constant temperature to maintain the stability of the internal working environment.Internal dynamics design of the wind, fast from excess heat.Fast automatic digital calibration peaks.Two-box structure, strong anti-interference ability and easy hardware upgrades.The development of working methods of arbitrary equipment.Quantitative analysis: including the experience coefficient method, theory a coefficient method and fundamental parameter method.

10.Qualitative analysis: including line marking Kl law, comparative law spectra, such as the cursor automatically find peak.

11.Test statements independent design based on customer requirements.

Specifications

Overall dimensions: 600mm × 510mm × 350mm Can test the sample size: warehouse clearance measurement: 330mm × 340mm × 115mm (Opening measurement: infinite) Instrument Weight: 50 kg Working ambient temperature :0 - 35 °CThe working environment relative humidity: ≤ 80%Element analysis: aluminum (Al) - Uranium (U)Content analysis: 1PPM - 99.999%Measurement time :60 - 180 seconds adjustableExcitation source: low-power X-ray tube

10.Detector: The United States imported Amptek electric refrigeration semiconductor detector Si-Pin

11.Instrument resolution: 55Fe in the energy MnKα line 5.9Kev, resolution better than 149eV

12.Multi-Channel Analyzer: 2048

13.Software: WINDOWS-based software, a powerful work

14.Customers can carry out the secondary development of any number of self-developed analytical methods

15.Working power: AC 220V 50Hz

X-ray fluorescence spectrometer/xrf analyzer/X-ray fluorescence analyzer SQ-4600