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Overview
OTM2500 OTN transport test module is one of OPWILL’s modular test products. OTM2500 series can be configured on OTP6200 and OTP6800 test platforms to achieve complete PDH/SDH/SONET/OTN test functionalities and offer comprehensive test solutions for metro network. It is a high cost-effective network test product.
Offer test functions from PDH/DSn1.5M to 2.5G/10G SDH/SONET/OTNAutomatic signal structure discovery in smartmode; automatically detect and monitor error pathsIntuitionistic user interface, fast configuration of signal pathsCustomizable various forms of test reportHighly Integrated SDH/SONET/OTN Test Module
OTM2500 series SDH/SONET/OTN test module could supply complete metro test functionalities with highly integrated functions. It is a perfect test tool for service provider deploying, running and maintaining transport network quickly and efficiently.
2-slot designed can be housed in OTP6200 and OTP6800 platforms.
PDH / SDH /SONET Test Features | |
| Support various PDH/SDH test interfaces:.1.5M/2M/34M/45M/140M/155M electrical interface, 155M/622M/2.5G/10G optical interfaceMixed and bulk payload generation and analysis from 1.5Mbit/s to 10 Gbit/sHigh-order and low-order mappingsIndependent transmitter and receiver testingAll PDH/SDH/SONET interfaces support End-to-end or loopback BER testingRound-trip delay measurementsHigh-order and low-order pointer generation and monitoringSection/RS, line/MS, high-order and low-order path overhead manipulation and monitoring, alarm/error generation and monitoringTandem connection monitoringPerformance monitoring:G.821,G.826,G.828,G.829,M.2100,M.2101Frequency analysis and power measurementFrequency offset generationAutomatic protection switching and service disruption time measurements | |
OTN Test Features | |
| Support OTU1 (2.7Gbit/s)/OTU2 (10.7Gbit/s) optical interface testBERT and FEC analysis of OTU1/OTU2 according to ITU-T G.709 framesRound-trip delay measurementsIndependent transmitter and receiver testingOTN alarm generation and monitoringOTN overhead manipulation and captureFrequency analysis and power measurementFrequency offset generationAutomatic protection switching and service disruption time measurements | |
OTM2500 OTN Series Specifications
SPECIFICATIONS | ||
Test Interfaces | ||
XFP 10G(10.7G) optical interface (STM-64/OC-192/OTU2) | ||
SFP 155M/622M/2.5G(2.7G) optical interface (STM-1/4/16, OC-3/12/48, OTU1) | ||
BNC 155M electrical interface (STM-1e/STS-3e) | ||
BNC 1.5M/2M/34M/45M/140M PDH electrical interface (DS1/E1/E3/DS3/E4) | ||
Test Features | ||
OTN | ||
Payloads | Support mapping/demapping of AU-3/AU-4/AU-4-4c/AU-4-16c to OTU1 Support mapping/demapping of AU-3/AU-4/AU-4-4c/AU-4-16c/AU-4-64c to OTU2 Support multiplexing/demultiplexing of ODU1->ODU2 | |
Test patterns | PBBS | 2E23,2E31 |
User programmable | Allowing user define 8-byte test pattern | |
Error injection | FAS,BIP-8(SM, PM, TCM1-6),BEI(SM, PM, TCM1-6), Bit,FECcorrectable bit, FECcorrectable code word, FECuncorrectable code word | |
Alarm generation | OTU:LOF,OOF ,LOM, OOM,AIS,SM-BDI,SM-IAE,SM-TIM,SM-BIAE ODU:AIS,ODU-OCI,ODU-LCK TCM1~6:BDI,IAE,TIM,LTC,BIAE PM:BDI,TIM | |
Test result | Error | FAS,BIP-8(SM, PM, TCM1-6),BEI(SM, PM, TCM1-6), Bit,FECcorrectable bit, FECcorrectable code word, FECuncorrectable code word |
Alarm | OTU:LOF,OOF,LOM, OOM ,AIS,SM-BDI,SM-IAE,SM-TIM,SM-BIAE ODU:AIS,ODU-OCI,ODU-LCK TCM1~6:BDI,IAE,TIM,LTC,BIAE PM:BDI,TIM | |
Overhead features | Manipulation and capture
| Overhead setting: all bytes are editable, not including MFAS, SM BIP, PM BIP, TCM1-6 BIP Continuous and variable capture ability Display integrated overhead |
Protection switching time | Term of service disruption | Alarm: LOS, LOM, OOM, SM-IAE, SM-BIAE, ODU-AIS, ODU-OCI, ODU-LCK, PM-BDI; Error: MFAS, PM-BIP, PM-BEI, payload errors |
Delay | Time test precision 0.1ms | |
OTM 2500 OTN Test Module